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K8000-M/L
A professional and efficient storage chip testing platform, offering a one-stop solution for CP and FT testing of eFlash, NOR Flash, NAND Flash, ReRAM, MRAM, and other types of chips. Number of slots: 26/40 Maximum digital channels: 9,728 ch Water-cooling system
Back to listProduct Description
>.NET Framework: an open software architecture that facilitates secondary development and provides seamless support for third-party component extensions;
>Provides a variety of ATE industry debugging tools and standards: supports STDf, Shmoo Tool, Wave Tracer, and Fail Bitmap Tool.
>D-link/C-link proprietary protocol bus, enabling separation of the control plane and the data plane;
> Employs a chained file encryption algorithm, delivering a high‑security, highly efficient information security strategy.
>Supports dynamic compilation, resulting in higher compilation efficiency.
>Supports customization of customer testing resources;
> Employs the latest-generation liquid-cooled refrigerant, with a total liquid-cooling heat dissipation capacity of 50 kW.
>K8000-M supports up to 11+1, and K8000-L supports up to 17+1; with multi‑power supply backup redundancy technology, system reliability is significantly enhanced.
>High-density DPS line card, with a single board addressing multiple power supplies and high-current requirements;
>Supports channel aggregation, breaking through the single-channel current bottleneck; (not supported at this time)
>Supports direct docking
>Independent resources per site
Technical indicators
| Category | Key Spec | K8000-M | K8000-L |
| SLOT | slot | 26 | 40 |
| Digital | Data Rate | 600Mbps | |
| Digital channel count | 6400 | 9728 | |
| PPMU | Per Pin (VSIM, ISVM, MVM) (-1.5 V to +6.4 V, ±50 mA) | ||
| Differential I/O | No | ||
| DPS | High Voltage DPS | 270 Channels /Board (-6~30V,120mA) | |
| DPS | 64 Channels /Board ( -6V~13.5V ) | ||
| ALPG | ALPG Address Data | 24X/24Y/24Z/36D | |
| ALPG memory depth | 4 kW (supports dynamic reconfiguration) | ||
| Address fail memory depth | 1Gbit/ch | ||
| Fail capture memory capacity | 1KW | ||
| Universal buffer memory | 4K*36bit/DUT | ||
| Data buffer memory | 1Gb/ch | ||
| Data fail analysis memory | 512bit*512 | ||
| Bad block memory depth | 1KW/DUT | ||
| Bad block counter | 16bit/DUT | ||
| address fail counter | 32bit/DUT | ||
| Bit fail counter | 32bit*4/ch | ||
| Timing Generator | Number of timing edges | 10 timing edges/pin (4 drive + 2 drive enable + 4 compare) | |
| TS on-the-fly | 62 | ||
| EPA | <±200 ps | ||
| OTA | <±450ps | ||
| Others | Heat dissipation | Liquid cooling | |
| MTBF | >5000h | ||
Contact Us
National Service Hotline:021-20940020
Email:marketing@ncatest.com
Shanghai (Headquarters)
Address:2nd Floor, Building 2, Block 1, Gangcheng Plaza, No. 128 Yunjuan Road, Lingang New City, Pudong New Area, Shanghai
Shanghai (Zhangjiang Office)
Address:Room 101-1, Floor 1, Building 1, Zhangjiang Microelectronics Port, No. 690 Bibo Road, Pudong New Area, Shanghai
Nantong (Subsidiary)
Address:C2, Weite Science and Technology Park, No. 3 Fuxing East Road, Nantong Economic and Technological Development Zone, Jiangsu Province
Hangzhou (Subsidiary)
Address:Room 208, Building D, No. 858, Jianshe Second Road, Xiaoshan District, Hangzhou City, Zhejiang Province
Wuhan (Branch Office)
Address:Room 001, Floor 7, Building D2, Phase III, Wuhan Software New City, Hongshan District, Wuhan, Hubei Province
Hefei (Branch Office)
Address:Room 412, Building 1, Anhui Ruide Lixin Medical Technology Industry Incubation Park, Shushan District, Hefei City, Anhui Province
Changsha (Subsidiary)
Address:East end of the second floor and part of the first floor of Building No. 3, No. 39 Nanshan Road, Quantang Subdistrict, Changsha City, Hunan Province